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T00200 - SEMI T2 - Specification for Marking of Wafers With a Two Dimensional Dot Matrix Revision:SEMI T2-0298E - Superseded 5 Because carrier lifetime is

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Description

5  Because carrier lifetime is directly influenced by the presence of metallic impurity contamination

SEMI T3-0697 (complete rewrite)

customers of such wafers may find that this Specification is useful guides in defining their requirements

This Standard does not apply to computing devices of programmable logic controllers (PLCs)

T00200 - SEMI T2 - Specification for Marking of Wafers With a Two Dimensional Dot Matrix Revision:SEMI T2-0298E - Superseded 5 Because carrier lifetime isReferenced SEMI Standards

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